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Mateck Sapphire Aluminium oxide Substrate, Al2O3

Category Ceramic , Oxide , Aluminum Oxide
Manufacturer Mateck GmbH
Trade Name
Port Ningbo port,China
Trade Terms FOB, CFR, CIF
Payment Terms L/C, T/T, Western Union
Download PDF Mateck Sapphire Aluminium oxide Substrate, Al2O3.pdf
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Material Notes:
Substrate single crystals for superconductivity.
Physical Properties Metric English Comments
Density 3.98 g/cc
0.144 lb/in³
a Lattice Constant 4.77 Å
4.77 Å
c Lattice Constant 13.04 Å
13.04 Å
Thermal Properties Metric English Comments
CTE, linear 5.00 µm/m-°C
2.78 µin/in-°F
perpendicular C-axis
6.70 µm/m-°C
3.72 µin/in-°F
parallel C-axis
Melting Point 2040 °C
3700 °F
Electrical Properties Metric English Comments
Dielectric Constant 9.0
9.0
parallel c-axis
11.5
11.5
perpendicular c-axis
Dielectric Loss Index 0.000030

@Frequency 1.00e+10 Hz
 0.000030

@Frequency 1.00e+10 Hz
 parallel C-axis
0.000086

@Frequency 1.00e+10 Hz
 0.000086

@Frequency 1.00e+10 Hz
 perpendicular C-axis
Descriptive Properties Value Comments
Flatness (µm/10mm), max 0.3
Growth Techniques Czochralski
Orientation (0001), (1-102), (11-20)
Orientation Accuracy ( ° ), Max 0.5
Parallelness ( ° ), max 0.3
Polishing one side or both sides epi-polished
Production Method Czochralski, HEM, Verneuil
Roughness of surface (angstroms), max 10
Scratches none
Standard Size (mm) 10 x 10 x 1 or 0.5
State monocrystalline
Structure hexagonal
Surface Quality with light microscope without defects
Tolerance of Length (mm) ± 0.02
Tolerance of Thickness (mm) ± 0.02
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